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Channel Thickness Scaling Effect on SnS2 Field Effect Transistors by Argon Plasma Layer Thinning Process
- Authors
- 이승백
- Issue Date
- 1-Jul-2015
- Place
- Coex, Seoul
- Conference Name
- The 13th international Nanotech Symposium
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)