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Evaluation of interface trap density between MoS2 layer and dielectrics in suspended MoS2 transistor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김은규 | - |
| dc.date.accessioned | 2021-08-03T07:50:00Z | - |
| dc.date.available | 2021-08-03T07:50:00Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2015-04-24 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/40703 | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Evaluation of interface trap density between MoS2 layer and dielectrics in suspended MoS2 transistor | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 김은규 | - |
| dc.identifier.bibliographicCitation | 2015년 한국물리학회 봄학술논문발표회 | - |
| dc.relation.isPartOf | 2015년 한국물리학회 봄학술논문발표회 | - |
| dc.citation.title | 2015년 한국물리학회 봄학술논문발표회 | - |
| dc.citation.conferencePlace | 대전컨벤션센터 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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