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Axially perpendicular offset (APO) Raman scheme for non-destructive measurement of samples in various containers
- Authors
- 정회일
- Issue Date
- 20-Nov-2014
- Publisher
- (사)한국분석과학회
- Citation
- 제 53회 한국분석과학회 추계학술대회
- Conference Name
- 제 53회 한국분석과학회 추계학술대회
- Place
- 제주도
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Collections - 서울 자연과학대학 > 서울 화학과 > 2. Conference Papers
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Related Researcher
- Chung, Hoeil
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF CHEMISTRY)