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Electrical characteristics of curved CMOS image sensors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김태환 | - |
| dc.date.accessioned | 2021-08-03T09:48:03Z | - |
| dc.date.available | 2021-08-03T09:48:03Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2014-07-02 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/43694 | - |
| dc.publisher | Korea Nano Technology Research Society, Nano Technology Research Association | - |
| dc.title | Electrical characteristics of curved CMOS image sensors | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 김태환 | - |
| dc.identifier.bibliographicCitation | The 12th International Nanotech Symposium & Nano-Convergence Expo | - |
| dc.relation.isPartOf | The 12th International Nanotech Symposium & Nano-Convergence Expo | - |
| dc.citation.title | The 12th International Nanotech Symposium & Nano-Convergence Expo | - |
| dc.citation.conferencePlace | Coex, Seoul, Korea | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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