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Nanoelectromechanical Logical Gates Utilising Selective Tungsten Chemical Vapor Deposition

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dc.contributor.authorToan, Nguyen Van-
dc.contributor.authorZhao, Dong-
dc.contributor.authorInomata, Naoki-
dc.contributor.authorToda, Masaya-
dc.contributor.authorSong, Yun Heub-
dc.contributor.authorOno, Takahito-
dc.date.accessioned2021-07-30T05:23:03Z-
dc.date.available2021-07-30T05:23:03Z-
dc.date.issued2019-06-
dc.identifier.issn2167-0013-
dc.identifier.issn2167-0021-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4557-
dc.description.abstractNAND and NOR logical gates based on the electrostatically driven silicon nanoelectromechanical (NEM) switches coated tungsten (W) are designed, fabricated and evaluated. A selectively conformal W deposition on high aspect ratio silicon structures is investigated. Logical gates are successfully fabricated and all their functions have been proved. This work opens the possibility not only for producing the complex mechanical logic systems but also for a way to reducing capacitive gap width.-
dc.format.extent3-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-
dc.titleNanoelectromechanical Logical Gates Utilising Selective Tungsten Chemical Vapor Deposition-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1109/TRANSDUCERS.2019.8808313-
dc.identifier.scopusid2-s2.0-85071926204-
dc.identifier.wosid000539487000432-
dc.identifier.bibliographicCitationInternational Solid-State Sensors, Actuators and Microsystems Conference, pp 1709 - 1711-
dc.citation.titleInternational Solid-State Sensors, Actuators and Microsystems Conference-
dc.citation.startPage1709-
dc.citation.endPage1711-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.subject.keywordPlusSWITCHES-
dc.subject.keywordPlusActuators-
dc.subject.keywordPlusAspect ratio-
dc.subject.keywordPlusChemical vapor deposition-
dc.subject.keywordPlusMicrosystems-
dc.subject.keywordPlusNAND circuits-
dc.subject.keywordPlusElectrostatically driven-
dc.subject.keywordPlusHigh aspect ratio-
dc.subject.keywordPlusLogical gates-
dc.subject.keywordPlusMechanical logic-
dc.subject.keywordPlusNAND-
dc.subject.keywordPlusNano-electromechanical-
dc.subject.keywordPlusNanoelectromechanical switches-
dc.subject.keywordPlusSilicon structures-
dc.subject.keywordPlusSolid-state sensors-
dc.subject.keywordAuthorLogical gates-
dc.subject.keywordAuthorNAND-
dc.subject.keywordAuthornanoelectromechanical switches-
dc.subject.keywordAuthorNOR-
dc.subject.keywordAuthorselective chemical vapor deposition-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8808313-
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