Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Physical Modeling for Program speed of SONOS cells with 3D Gate-All-Around (GAA) Charge Trap Memories
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송윤흡 | - |
| dc.date.accessioned | 2021-08-03T11:21:19Z | - |
| dc.date.available | 2021-08-03T11:21:19Z | - |
| dc.date.issued | 2013-11-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/46140 | - |
| dc.title | Physical Modeling for Program speed of SONOS cells with 3D Gate-All-Around (GAA) Charge Trap Memories | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 14th International Conference on Computers, Communications and Systems | - |
| dc.citation.conferencePlace | 대구대학교 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)