Design of a Broadband Electric Near-Field Probe with Improved Sensitivity Using Additional Tips
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Yuntae | - |
dc.contributor.author | Bang, Jihoon | - |
dc.contributor.author | Jung, Kibum | - |
dc.contributor.author | Choi, Jaehoon | - |
dc.date.accessioned | 2021-07-30T05:24:24Z | - |
dc.date.available | 2021-07-30T05:24:24Z | - |
dc.date.created | 2021-05-13 | - |
dc.date.issued | 2019-01 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4623 | - |
dc.description.abstract | A low-cost miniature broadband electric field probe for electric near-field measurements is proposed. To improve the sensitivity of the probe, additional rectangular tips with the optimized dimension of 0.5 mm X 1 mm x 0.017 mm are added in the proposed probe design. The calculated S-21 of the proposed design with additional tips is improved by about 7 dB over the operating frequency band ranging from 1 MHz to 6 GHz, comparing to that of the design without additional tips. The half spatial resolutions of the proposed design at 3 GHz and 6 GHz are 2.19 mm and 1.97 mm, respectively. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Design of a Broadband Electric Near-Field Probe with Improved Sensitivity Using Additional Tips | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, Jaehoon | - |
dc.identifier.scopusid | 2-s2.0-85062796272 | - |
dc.identifier.wosid | 000461368600418 | - |
dc.identifier.bibliographicCitation | ISAP 2018 - 2018 International Symposium on Antennas and Propagation, pp.1 - 2 | - |
dc.relation.isPartOf | ISAP 2018 - 2018 International Symposium on Antennas and Propagation | - |
dc.citation.title | ISAP 2018 - 2018 International Symposium on Antennas and Propagation | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 2 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Telecommunications | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Telecommunications | - |
dc.subject.keywordPlus | Electric fields | - |
dc.subject.keywordPlus | Electromagnetic pulse | - |
dc.subject.keywordPlus | Signal interference | - |
dc.subject.keywordPlus | High sensitivity | - |
dc.subject.keywordPlus | Low costs | - |
dc.subject.keywordPlus | Near field probes | - |
dc.subject.keywordPlus | Near-field measurement | - |
dc.subject.keywordPlus | Operating frequency bands | - |
dc.subject.keywordPlus | Probe design | - |
dc.subject.keywordPlus | Sensitivity of the probe | - |
dc.subject.keywordPlus | Spatial resolution | - |
dc.subject.keywordPlus | Probes | - |
dc.subject.keywordAuthor | electric field probe | - |
dc.subject.keywordAuthor | electromagnetic interference (EMI) | - |
dc.subject.keywordAuthor | high-sensitivity probe | - |
dc.subject.keywordAuthor | near-field measurements | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/8627864 | - |
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