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Design of a Broadband Electric Near-Field Probe with Improved Sensitivity Using Additional Tips

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dc.contributor.authorPark, Yuntae-
dc.contributor.authorBang, Jihoon-
dc.contributor.authorJung, Kibum-
dc.contributor.authorChoi, Jaehoon-
dc.date.accessioned2021-07-30T05:24:24Z-
dc.date.available2021-07-30T05:24:24Z-
dc.date.created2021-05-13-
dc.date.issued2019-01-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4623-
dc.description.abstractA low-cost miniature broadband electric field probe for electric near-field measurements is proposed. To improve the sensitivity of the probe, additional rectangular tips with the optimized dimension of 0.5 mm X 1 mm x 0.017 mm are added in the proposed probe design. The calculated S-21 of the proposed design with additional tips is improved by about 7 dB over the operating frequency band ranging from 1 MHz to 6 GHz, comparing to that of the design without additional tips. The half spatial resolutions of the proposed design at 3 GHz and 6 GHz are 2.19 mm and 1.97 mm, respectively.-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleDesign of a Broadband Electric Near-Field Probe with Improved Sensitivity Using Additional Tips-
dc.typeArticle-
dc.contributor.affiliatedAuthorChoi, Jaehoon-
dc.identifier.scopusid2-s2.0-85062796272-
dc.identifier.wosid000461368600418-
dc.identifier.bibliographicCitationISAP 2018 - 2018 International Symposium on Antennas and Propagation, pp.1 - 2-
dc.relation.isPartOfISAP 2018 - 2018 International Symposium on Antennas and Propagation-
dc.citation.titleISAP 2018 - 2018 International Symposium on Antennas and Propagation-
dc.citation.startPage1-
dc.citation.endPage2-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusElectric fields-
dc.subject.keywordPlusElectromagnetic pulse-
dc.subject.keywordPlusSignal interference-
dc.subject.keywordPlusHigh sensitivity-
dc.subject.keywordPlusLow costs-
dc.subject.keywordPlusNear field probes-
dc.subject.keywordPlusNear-field measurement-
dc.subject.keywordPlusOperating frequency bands-
dc.subject.keywordPlusProbe design-
dc.subject.keywordPlusSensitivity of the probe-
dc.subject.keywordPlusSpatial resolution-
dc.subject.keywordPlusProbes-
dc.subject.keywordAuthorelectric field probe-
dc.subject.keywordAuthorelectromagnetic interference (EMI)-
dc.subject.keywordAuthorhigh-sensitivity probe-
dc.subject.keywordAuthornear-field measurements-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8627864-
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