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Three-Bit Hot/Cold Page Clustering Mechanism for Improving Endurance of Flash Memory
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 차재혁 | - |
| dc.date.accessioned | 2021-08-03T13:18:50Z | - |
| dc.date.available | 2021-08-03T13:18:50Z | - |
| dc.date.issued | 2013-03-27 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/48831 | - |
| dc.title | Three-Bit Hot/Cold Page Clustering Mechanism for Improving Endurance of Flash Memory | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | World Conference on Information Systems and Technologies (WorldCIST'13) | - |
| dc.citation.conferencePlace | Algarve, Portugal | - |
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Collections - 서울 공과대학 > 서울 컴퓨터소프트웨어학부 > 2. Conference Papers
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Related Researcher
- Cha, Jae Hyuk
- COLLEGE OF ENGINEERING (SCHOOL OF COMPUTER SCIENCE)