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Langmuir probes for the measurement of negative ions

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dc.contributor.author정규선-
dc.date.accessioned2021-08-03T13:19:32Z-
dc.date.available2021-08-03T13:19:32Z-
dc.date.created2021-06-30-
dc.date.issued2013-02-26-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/48908-
dc.publisher국가핵융합연구소-
dc.titleLangmuir probes for the measurement of negative ions-
dc.typeConference-
dc.contributor.affiliatedAuthor정규선-
dc.identifier.bibliographicCitation2013 KSTAR Conference-
dc.relation.isPartOf2013 KSTAR Conference-
dc.citation.title2013 KSTAR Conference-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 전기공학전공 > 2. Conference Papers

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서울 공과대학 (서울 전기공학전공)
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