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Dependence of Memory Margin of Fully Depleted (FD) Silicon on Thin BOX (SOTB) Capacitor-less Memory Cells on Top Silicon Thickness and Back Bias
- Authors
- 박재근
- Issue Date
- 25-Oct-2012
- Place
- 보광휘닉스파크
- Conference Name
- 한국물리학회 2012년도 가을학술논문발표회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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