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Multi-wavelength High Resolution Micro-Raman Characterization of Si1-xGex on Insulator Prepared with a High Temperature Ge Condensation Technique
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박재근 | - |
| dc.date.accessioned | 2021-08-03T14:34:03Z | - |
| dc.date.available | 2021-08-03T14:34:03Z | - |
| dc.date.issued | 2012-08-28 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/50836 | - |
| dc.title | Multi-wavelength High Resolution Micro-Raman Characterization of Si1-xGex on Insulator Prepared with a High Temperature Ge Condensation Technique | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | IUMRS-ICA 2012 | - |
| dc.citation.conferencePlace | 부산 BEXCO APEC Hall | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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