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The effect of the trap density on the leakage current in organic bistable devices and improvement using the blocking layer

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dc.contributor.author김태환-
dc.date.accessioned2021-08-03T14:35:39Z-
dc.date.available2021-08-03T14:35:39Z-
dc.date.created2021-06-30-
dc.date.issued2012-08-16-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/51003-
dc.publisherMinistry of Education, Science and Technology-
dc.titleThe effect of the trap density on the leakage current in organic bistable devices and improvement using the blocking layer-
dc.typeConference-
dc.contributor.affiliatedAuthor김태환-
dc.identifier.bibliographicCitationThe 10th international nanotech symposium & Nano-Convergence Expo (NANO KOREA 2012)-
dc.relation.isPartOfThe 10th international nanotech symposium & Nano-Convergence Expo (NANO KOREA 2012)-
dc.citation.titleThe 10th international nanotech symposium & Nano-Convergence Expo (NANO KOREA 2012)-
dc.citation.conferencePlaceCoex, Seoul-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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