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Study on effect of various grain boundarys in vertical channel SONOS NAND flash
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이승백 | - |
| dc.date.accessioned | 2021-08-03T14:48:59Z | - |
| dc.date.available | 2021-08-03T14:48:59Z | - |
| dc.date.issued | 2012-06-27 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/51300 | - |
| dc.title | Study on effect of various grain boundarys in vertical channel SONOS NAND flash | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2012년도 대한전자공학회 하계학술대회 | - |
| dc.citation.conferencePlace | Jeju Grand Hotel, 제주도 | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)