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Thermal stability and charge loss mechanism of V3Si nano-particles memory device

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dc.contributor.author김은규-
dc.date.accessioned2021-08-03T14:49:11Z-
dc.date.available2021-08-03T14:49:11Z-
dc.date.created2021-06-30-
dc.date.issued2012-06-26-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/51318-
dc.publisherNanoSEA2012 Organizing Committee-
dc.titleThermal stability and charge loss mechanism of V3Si nano-particles memory device-
dc.typeConference-
dc.contributor.affiliatedAuthor김은규-
dc.identifier.bibliographicCitation4th Inter. Conf. on Nano-Structrures Self-assembly(NanoSEA2012)-
dc.relation.isPartOf4th Inter. Conf. on Nano-Structrures Self-assembly(NanoSEA2012)-
dc.citation.title4th Inter. Conf. on Nano-Structrures Self-assembly(NanoSEA2012)-
dc.citation.conferencePlaceSardinia, Italy-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

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