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Design of Extremely Proximity Gettering using MeV-nitrogen Ion Implantation for Si C-MOS Image Sensor
- Authors
- 박재근
- Issue Date
- 10-May-2012
- Place
- Sheraton Seattle Hotel, Seattle, USA
- Conference Name
- 2012 SiWEDS Spring Meeting
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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