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Electrical characterization of flash memory structure with vanadium silicide nano-particles
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김은규 | - |
| dc.date.accessioned | 2021-08-03T16:33:35Z | - |
| dc.date.available | 2021-08-03T16:33:35Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2011-10-26 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/53766 | - |
| dc.publisher | The Japan Society of Applied Physics | - |
| dc.title | Electrical characterization of flash memory structure with vanadium silicide nano-particles | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 김은규 | - |
| dc.identifier.bibliographicCitation | 24th Inter. Microprocesses and Nanotechnology Conf. (MNC2011) | - |
| dc.relation.isPartOf | 24th Inter. Microprocesses and Nanotechnology Conf. (MNC2011) | - |
| dc.citation.title | 24th Inter. Microprocesses and Nanotechnology Conf. (MNC2011) | - |
| dc.citation.conferencePlace | Kyoto, Japan | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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