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Carrier Charging Effect of V3Si Nanocrystals in Floating Gate Memory Structure
- Authors
- 김은규
- Issue Date
- 6-Jul-2011
- Publisher
- Chinese Vacuum Society
- Citation
- 3rd Inter. Conf. on Microelectron. and Plasma Tech.
- Conference Name
- 3rd Inter. Conf. on Microelectron. and Plasma Tech.
- Place
- Dalian, China
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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