Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
"Double-layer" Method to Improve Image Quality of Industrial SPECT
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김찬형 | - |
| dc.date.accessioned | 2021-08-03T17:19:21Z | - |
| dc.date.available | 2021-08-03T17:19:21Z | - |
| dc.date.issued | 2011-07-03 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/54828 | - |
| dc.title | "Double-layer" Method to Improve Image Quality of Industrial SPECT | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 13th International Workshop on Radiation Imaging Detectors | - |
| dc.citation.conferencePlace | Zurich and Villigen PSI, Switzerland | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 원자력공학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Chan Hyeong
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)