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Bulk-contact 구조를 이용한 Bit Cost Scalable (BiCS) NAND Flash Memory의 Erase 특성 개선
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송윤흡 | - |
| dc.date.accessioned | 2021-08-03T17:20:26Z | - |
| dc.date.available | 2021-08-03T17:20:26Z | - |
| dc.date.issued | 2011-06-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/54929 | - |
| dc.title | Bulk-contact 구조를 이용한 Bit Cost Scalable (BiCS) NAND Flash Memory의 Erase 특성 개선 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2011년 대한전자공학회 하계종합학술대회 | - |
| dc.citation.conferencePlace | 제주 라마다호텔 | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)