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Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이승백 | - |
| dc.date.accessioned | 2021-08-03T18:33:02Z | - |
| dc.date.available | 2021-08-03T18:33:02Z | - |
| dc.date.issued | 2010-11-15 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/56700 | - |
| dc.title | Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 11th Asia Pacific Physics Conference | - |
| dc.citation.conferencePlace | Shanghai, China | - |
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- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)