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Dependence of Memory Margin on Interface Trap Density in the Cap-less Memory Cell
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박재근 | - |
| dc.date.accessioned | 2021-08-03T19:51:29Z | - |
| dc.date.available | 2021-08-03T19:51:29Z | - |
| dc.date.issued | 2010-04-26 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/58978 | - |
| dc.title | Dependence of Memory Margin on Interface Trap Density in the Cap-less Memory Cell | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2010 ECS 217th Meeting | - |
| dc.citation.conferencePlace | Canada/ Vancouver Fairmont Hotel Vancouver & Hyatt | - |
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