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Experimental Test of Double-layer Method for Industrial SPECT
- Authors
- 김찬형
- Issue Date
- 18-Apr-2010
- Place
- Las Vegas, USA
- Conference Name
- Radiation Protection and Shielding Division 2010 Topical Meeting
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Collections - 서울 공과대학 > 서울 원자력공학과 > 2. Conference Papers
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Related Researcher
- Kim, Chan Hyeong
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)