“Double-layer” Method to Improve Image Quality of Industrial SPECT

Abstract

Single photon emission computed tomography (SPECT) is a promising technique for determining the details of flow, including multiphase flow, in industrial process units. Currently, the Korea Atomic Energy Research Institute (KAERI) and Hanyang University are collaborating to develop an industrial SPECT that is composed of 24 NaI(Tl) scintillation detectors arranged in a hexagonal shape. In the present study, a very simple method, called "double-layer" method, is proposed to improve the image quality of the industrial SPECT. The rational of the method is using two layers of identical SPECTs to increase the number of acquisitions views, i.e., from 6 to 12 angles in the present case. For this, one industrial SPECT is rotated by 30 degrees with respect to the other SPECT. The performance of the double-layer method was predicted by Monte Carlo simulations using MCNPX and Geant4 for different gamma sources, 99mTc (140 keV) and 68Ga (1,077 keV) and different source geometries. The simulation results were very encouraging; that is, the double-layer method significantly improve the image quality of the industrial SPECT, especially when the distribution of radioactive tracer is not simple in the flow system.