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Thermal stability and Electrical Charcteristics of Lanthanum-Aluminum Oxide films annealed in va-cuum and N2 ambient
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 전형탁 | - |
| dc.date.accessioned | 2021-08-03T21:37:12Z | - |
| dc.date.available | 2021-08-03T21:37:12Z | - |
| dc.date.issued | 2009-06-08 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/61535 | - |
| dc.title | Thermal stability and Electrical Charcteristics of Lanthanum-Aluminum Oxide films annealed in va-cuum and N2 ambient | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | E-MRS 2009 Spring Meeting | - |
| dc.citation.conferencePlace | congress center strasbourg, France | - |
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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