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Study on carrier trapping and emission processes in InAs/GaAs self-assembled quantum dots by varying filling pulse width during DLTS measurements

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dc.contributor.author김은규-
dc.date.accessioned2021-08-03T23:34:03Z-
dc.date.available2021-08-03T23:34:03Z-
dc.date.created2021-06-30-
dc.date.issued2008-07-08-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/64263-
dc.publisherUniv. of Rome Tor Vergata-
dc.titleStudy on carrier trapping and emission processes in InAs/GaAs self-assembled quantum dots by varying filling pulse width during DLTS measurements-
dc.typeConference-
dc.contributor.affiliatedAuthor김은규-
dc.identifier.bibliographicCitation2nd Inter. Conf. on Nanostructures SELF-Assembly-
dc.relation.isPartOf2nd Inter. Conf. on Nanostructures SELF-Assembly-
dc.citation.title2nd Inter. Conf. on Nanostructures SELF-Assembly-
dc.citation.conferencePlaceRome, Italy-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

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