Defect engineering of GaN epi-layers by electron-beam irradiation and post thermal annealing process
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김은규 | - |
dc.date.accessioned | 2021-08-04T00:23:34Z | - |
dc.date.available | 2021-08-04T00:23:34Z | - |
dc.date.created | 2021-06-30 | - |
dc.date.issued | 2007-12-13 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/65610 | - |
dc.publisher | The Korean Physical Society | - |
dc.title | Defect engineering of GaN epi-layers by electron-beam irradiation and post thermal annealing process | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | 김은규 | - |
dc.identifier.bibliographicCitation | 5th Inter. Conf. on Advanced Materials and Devices | - |
dc.relation.isPartOf | 5th Inter. Conf. on Advanced Materials and Devices | - |
dc.citation.title | 5th Inter. Conf. on Advanced Materials and Devices | - |
dc.citation.conferencePlace | Jeju, Korea | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
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