Langmuir-Blodgett Films of Dicyanopyrazine-Linked Porphyrin

Abstract

In this work, we have fabricated 2-DCPP multilayer Langmuir-Blodgett (LB) films on silanized Si(111) and quartz substrates. X-ray photoelectron spectroscopy (XPS) is used to analyze the structural compositions of 2-DCPP LB films. Atomic force microscopy (AFM) is performed to analyze the surface morphology of the LB films, and ellipsometry is used to measure the film thickness. UV-vis spectroscopy is performed to measure electronic transitions of the 2-DCPP films.