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Nanotopography Impact of Surfactant Concentration and Molecular Weight of Nano-ceria Slurry on Oxide Removal Rate and Remaining Oxide Thickness Variation after STI CMP

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dc.contributor.author백운규-
dc.date.accessioned2021-08-04T02:23:19Z-
dc.date.available2021-08-04T02:23:19Z-
dc.date.issued2006-11-03-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/68777-
dc.titleNanotopography Impact of Surfactant Concentration and Molecular Weight of Nano-ceria Slurry on Oxide Removal Rate and Remaining Oxide Thickness Variation after STI CMP-
dc.typeConference-
dc.citation.conferenceNameECS-2006 JOINT INTERNATIONAL MEETING-
dc.citation.conferencePlaceMoon Palace Hotel(Mexico)-
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서울 공과대학 > 서울 에너지공학과 > 2. Conference Papers

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