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Reliable PLS Analysis of Etching Solution by Pure Component Selectivity Analysis (PCSA)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정회일 | - |
| dc.date.accessioned | 2021-08-04T02:51:41Z | - |
| dc.date.available | 2021-08-04T02:51:41Z | - |
| dc.date.issued | 2006-06-29 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/69786 | - |
| dc.description.abstract | Pure component selectivity analysis was successfully utilized to enhance the robustness of a partial least squares (PLS) model by examining the selectivity of a given component to other components. The samples used in this study were composed of NH4OH, H2O2 and H2O, a popular etchant solution in the electronic industry. The selective determination of H2O2 without influences from NH4OH and H2O was a key issue since its molecular structure is similar to that of H2O and NH4OH also has a hydroxyl functional group. The best spectral ranges for the determination of NH4OH and H2O2 were found with the use of moving window PLS (MW-PLS) and corresponding selectivities were examined by pure component selectivity analysis (PCSA) based on the comparison between regression vectors from PLS and the net analyte signal (NAS). | - |
| dc.title | Reliable PLS Analysis of Etching Solution by Pure Component Selectivity Analysis (PCSA) | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Japan-Korea Joint Symposium on Near Infrared Spectroscopy | - |
| dc.citation.conferencePlace | 한양대학교 | - |
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