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Reliable PLS Analysis of Etching Solution by Pure Component Selectivity Analysis (PCSA)

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dc.contributor.author정회일-
dc.date.accessioned2021-08-04T02:51:41Z-
dc.date.available2021-08-04T02:51:41Z-
dc.date.issued2006-06-29-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/69786-
dc.description.abstractPure component selectivity analysis was successfully utilized to enhance the robustness of a partial least squares (PLS) model by examining the selectivity of a given component to other components. The samples used in this study were composed of NH4OH, H2O2 and H2O, a popular etchant solution in the electronic industry. The selective determination of H2O2 without influences from NH4OH and H2O was a key issue since its molecular structure is similar to that of H2O and NH4OH also has a hydroxyl functional group. The best spectral ranges for the determination of NH4OH and H2O2 were found with the use of moving window PLS (MW-PLS) and corresponding selectivities were examined by pure component selectivity analysis (PCSA) based on the comparison between regression vectors from PLS and the net analyte signal (NAS).-
dc.titleReliable PLS Analysis of Etching Solution by Pure Component Selectivity Analysis (PCSA)-
dc.typeConference-
dc.citation.conferenceNameJapan-Korea Joint Symposium on Near Infrared Spectroscopy-
dc.citation.conferencePlace한양대학교-
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