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Dependence of Forming-free GeSe based Conductive-Bridging Random-Access-Memory Characteristics on Thicknesses and Chemical Composition Ratio of GeSex

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dc.contributor.author박재근-
dc.date.accessioned2021-07-30T08:28:08Z-
dc.date.available2021-07-30T08:28:08Z-
dc.date.issued2020-11-05-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/7065-
dc.titleDependence of Forming-free GeSe based Conductive-Bridging Random-Access-Memory Characteristics on Thicknesses and Chemical Composition Ratio of GeSex-
dc.typeConference-
dc.citation.conferenceName2020 KPS fall meeting-
dc.citation.conferencePlaceOn-line-
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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