Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Detection and Image Procesing of Interfacial Micro-Delamination in the Thin-layered Structure by using Nonlinear Ultrasonic Effect
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 장경영 | - |
| dc.date.accessioned | 2021-08-04T03:50:05Z | - |
| dc.date.available | 2021-08-04T03:50:05Z | - |
| dc.date.issued | 2005-11-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/71159 | - |
| dc.title | Detection and Image Procesing of Interfacial Micro-Delamination in the Thin-layered Structure by using Nonlinear Ultrasonic Effect | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Advanced nondestructive Evaluation | - |
| dc.citation.conferencePlace | Jeju ICC, Korea | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.