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Oxidation study of InN thin film using X-ray photoemission spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김재용 | - |
| dc.date.accessioned | 2021-08-04T03:50:06Z | - |
| dc.date.available | 2021-08-04T03:50:06Z | - |
| dc.date.issued | 2005-11-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/71160 | - |
| dc.title | Oxidation study of InN thin film using X-ray photoemission spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 3rd International Symposium on Advanced Photonic Science and Technology | - |
| dc.citation.conferencePlace | Shanghai, China | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Kim, Jae yong
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)