Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Gate Bias Dependence of Low Frequency Noise in Poly-Si Thin-Film Transistors
- Authors
- 김은규
- Issue Date
- 15-Mar-2004
- Publisher
- 한국물리학회
- Citation
- 12th Seoul Inter. Symp. on Phys. of Semicond. and Appl.
- Conference Name
- 12th Seoul Inter. Symp. on Phys. of Semicond. and Appl.
- Place
- Gyeongju, Korea
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.