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A Compact Low-Cost Wideband Shielded-Loop Probe With Enhanced Performance for Magnetic Near-Field Measurements

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dc.contributor.authorBang, Jihoon-
dc.contributor.authorPark, Yuntae-
dc.contributor.authorJung, Kibum-
dc.contributor.authorChoi, Jaehoon-
dc.date.accessioned2021-08-02T08:51:50Z-
dc.date.available2021-08-02T08:51:50Z-
dc.date.issued2020-10-
dc.identifier.issn0018-9375-
dc.identifier.issn1558-187X-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/8890-
dc.description.abstractIn this article, a compact low-cost wideband planar shielded-loop probe with enhanced performance is proposed for magnetic near-field measurements. The probe is designed based on a stripline structure and fabricated on an FR4 printed circuit board with a four-layer stack-up structure. In the proposed design, an inverted G-shaped inductive folded line is arranged on an added layer to increase the sensitivity to the magnetic field response. The sensitivity, in terms of |S-21|, of the proposed magnetic near-field probe is improved relative to the conventional shielded-loop by an average of 5 dB over the frequency band ranging from 100 MHz to 6 GHz. Also, two additional techniques to enhance the electric field suppression capability of the planar shielded-loop probe are presented: repositioning the short via hole and mounting a metal can on the probe.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.titleA Compact Low-Cost Wideband Shielded-Loop Probe With Enhanced Performance for Magnetic Near-Field Measurements-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TEMC.2019.2946714-
dc.identifier.scopusid2-s2.0-85074479275-
dc.identifier.wosid000577982400033-
dc.identifier.bibliographicCitationIEEE Transactions on Electromagnetic Compatibility, v.62, no.5, pp 1921 - 1928-
dc.citation.titleIEEE Transactions on Electromagnetic Compatibility-
dc.citation.volume62-
dc.citation.number5-
dc.citation.startPage1921-
dc.citation.endPage1928-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusSENSITIVITY-
dc.subject.keywordAuthorProbes-
dc.subject.keywordAuthorMagnetic noise-
dc.subject.keywordAuthorMagnetic shielding-
dc.subject.keywordAuthorMagnetic circuits-
dc.subject.keywordAuthorSensitivity-
dc.subject.keywordAuthorMagnetic resonance-
dc.subject.keywordAuthorEquivalent circuits-
dc.subject.keywordAuthorElectromagnetic interference (EMI)-
dc.subject.keywordAuthornear-field measurement-
dc.subject.keywordAuthorplanar shielded-loop probe-
dc.subject.keywordAuthorperformance improvement-
dc.subject.keywordAuthorwideband magnetic-field probe-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8883298-
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