Brooks, Christopher; Jerad, Chadlia; Kim, Hokeun; Lee, Edward A.; Lohstroh, Marten; Nouvellet, Victor; Osyk, Beth; Weber, Matt
ArticleIssue Date2018CitationPROCEEDINGS OF THE IEEE, v.106, no.SI 9, pp.1527 - 1542PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC