ScholarWorks@Hanyang University: Journal : European Solid-State Device Research Conference

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European Solid-State Device Research Conference

Journal Title

European Solid-State Device Research Conference

ISSN

1930-8876

Publisher

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SJR	1999-2006;2012-2017;2019
SCOPUS	2017;2020

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Article List

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SCOPUS

Thermally robust atomic layer deposited ZrO2 gate dielectric films upon the post-deposition annealing Go to Link

Jung, H.-S.; Kim, H.K.; Lee, S.Y.; Lee, N.-I.; Park, T.J.; Hwang, C.S.

ArticleIssue Date2011CitationEuropean Solid-State Device Research Conference, pp.71 - 74

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