ScholarWorks@Hanyang University: CHOI, BYONG DEOK

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CHOI, BYONG DEOK (최병덕)

COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)

Research Area: 반도체 회로 설계 및 디스플레이

Tel 02-2220-2311
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data driver:6||AMOLED:4||TFTs:4||microdisplay:3||dynamic logic:3||Physical unclonable function:3||hardware security:3||Differential amplifier:2||mobile projector:2||TFTLCD:2||readout circuit:2||resistive sensor:2||logic circuit:2||DAC:2||column driver:2||sensor array:2||low power:2||physical unclonable function (PUF):2||Process variation:2||image quality:2||DFC (dynamic false contour):1||Decoder:1||Design rule:1||Driving method:1||External compensation:1||Flat panel display:1||Gate driver:1||HDTV TFTLCD:1||Hardware security:1||Identification:1||Image interpolation:1||Inductors:1||Integrateanddump receiver:1||Internet of Things:1||Internet of Things (IoT):1||LCD TV:1||LCD TVs:1||LCD driver:1||Microdisplay:1||Mismatch:1||Mode selection:1||OCDMA:1||OLED:1||OLEDoS:1||Onchip photodiode:1||Optical coherence:1||Optical energy harvesting:1||Optical secure circuit:1||Optical thresholding:1||PDP:1||PDP (plasma display panel):1||PFM:1||Peakcurrent control:1||Physical attack protection:1||Physical property:1||Random access:1||Readout circuit:1||Side channel attack (SCA):1||Slewrate:1||Switchmode power supply:1||Switches:1||TSOCDMA:1||TermsActive shield:1||Via formation:1||Voltage control:1||active matrix display:1||adiabatic logic:1||amorphous metal oxide semiconductor thinfilm transistors:1||authentication:1||bit error rate (BER):1||buck converter:1||buffer amplifier:1||capacitive readout system:1||capacitive sensors:1||carryfree gate driver:1||chargebalancing compensation:1||chopper stabilization:1||column driver IC:1||columnparallel ADC:1||contact:1||contact failure probability:1||correlated double sampling (CDS):1||counter:1||crosstalk:1||cubic convolution interpolation:1||dcdc converter:1||dcdc converter:1||decoder:1||differential power analysis (DPA):1||digitaltoanalog converter:1||digitaltoanalog converter (DAC):1||discard ratio:1||display noise suppression:1||driver circuit:1||driving system:1||dynamic comparator:1||electrical stress:1||electromigration:1||error correction code (ECC):1||fault injection attacks:1||flexible/stretchable display:1||gamma correction:1||gate driver:1||high resolution:1||image artifact:1||image resizing:1||invasive attack:1||largescreen and highformat display:1||level shifter:1||liquid crystal display:1||liquidcrystal display (LCD):1||logic circuits:1||low complexity:1||low power consumption:1||lowvoltage resistorstring DAC (LVDAC):1||luminance uniformity:1||mechanical stress:1||microprobing attempt:1||mobile display:1||motion picture:1||mutual capacitance readout circuit:1||mutual capacitive touch:1||noise reduction:1||offset:1||organic light emitting diode (OLED) display:1||organic passivation layer:1||output buffer:1||parasitic capacitance:1||physical attack protection:1||pixel charging ratio:1||pixel circuit:1||polySi TFT:1||polysi TFT:1||power management IC:1||preselection:1||process variation:1||pulse frequency modulation (PFM):1||reliability:1||row driver:1||secret key:1||secure circuit:1||selfcapacitance readout circuit:1||signal power degradation:1||spatially digitized electrode:1||stability:1||stepped output characteristics:1||stress distribution (vonMises stress):1||tactile sensor:1||tactile sensor array:1||temperature fault injection attacks:1||tensile strain:1||top metal shield:1||uniformity:1||via PUF:1||via formation:1||wearable electronic device:1||wide data voltage range:1||(microelectromechanical systems) MEMS microphone readout circuit:1||zero potential biasing:1||10bit gray scale:1||AIGZO:1||Activematrix display:1||Amorphous indiumgalliumzinc oxide thinfilm transistor (aIGZO TFT):1||Amorphous indiumgalliumzinc oxide thinfilm transistors:1||Amorphous indiumgalliumzincoxide thinfilm transistor (aIGZO TFT):1||Amorphous indiumgalliumzincoxide thinfilm transistors (aIGZO TFTs):1||Area efficiency:1||Authentication:1||Bit error rate (BER):1||Buck converter:1||Buck converters:1||Buckboost converter:1||CMOS image sensor (CIS):1||Capacitance:1||Charge sharing:1||Control systems:1||Crosstalk:1||DCDC converter:1||

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