ScholarWorks@Hanyang University: Bae, Suk Joo

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Bae, Suk Joo (배석주)

COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)

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Tel 02-2220-0473
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Reliability:7||Changepoint:6||Weibull distribution:5||Degradation model:5||Conditionbased maintenance:3||Burnin:3||wafer map:3||Membrane electrode assembly (MEA):3||maximum likelihood estimation:3||Wiener process:3||reliability:3||Pakistan:3||Accelerated degradation test:3||Gibbs sampling:3||Regression:2||Support Vector Machine:2||oneshot device:2||Polymer electrolyte membrane fuel cell:2||oxide breakdown:2||Support vector machine:2||Bayesian inference:2||Nonhomogeneous Poisson process:2||percolation model:2||Nonlinear randomcoefficients model:2||Accelerated degradation test (ADT):2||Blockchain:2||Hierarchical Bayesian model:2||Hierarchical Bayesian modeling:2||zeroinflated models:2||Anomaly Detection:2||Signal Processing:2||Pyrotechnic Mechanical Device(PMD):2||reliability analysis:2||Lithiumion battery:2||Direct methanol fuel cell (DMFC):2||minimal repair:2||mixture distribution:2||Failuretime distribution:2||spatial defects:2||spatial point process:2||Hurst exponent:2||Degradation modeling:2||Degradation test:2||Control Chart:2||Bayesian approach:2||Data depth:1||Data mining:1||Data models:1||Denoising Filter:1||Deep network architecture:1||Defect Patterns:1||Defense Industry:1||Defense Quality Management:1||Degradation Mechanisms:1||Degradation Model:1||Degradation analysis:1||Delta Method:1||Dengue virus:1||Denoising:1||Design of Experiments:1||Design of experiment:1||Diagnosis:1||Diagnosis model:1||Dimension Reduction:1||Direct Methanol Fuel Cell:1||Discrete Wavelet Transform:1||Discrimination:1||Dispersion:1||DoubleSpending Attack:1||Dropimpact:1||Durability:1||EM algorithm:1||Electronic Device Alignment System:1||Empirical Bayes:1||Empirical Bayes estimate:1||Equivalent circuit simulated:1||Excel:1||Explainable AI(XAI):1||Factorial Design:1||Feature Extraction:1||Field Failure Data:1||Fisher information matrix:1||Fractal structure:1||Fractional Brownian Motion:1||Fully Convolutional Data Description (FCDD):1||Functional Input Variable:1||Functional Reliability:1||Gibbs sampler:1||GoelOkumoto process:1||Hierarchical Bayesian:1||Hierarchical bayesian model:1||Homogeneous Poisson process:1||Hotelling T2 statistic:1||Hotelling&apos:1||Hurst Exponent:1||ICS repeater:1||Imperfect maintenance:1||Incremental capacity:1||Infectious diseases:1||Inspection Process:1||Integrated circuit modeling:1||InverseGaussian distribution:1||Jury chart:1||Korea national defense reform basic plan 2020:1||Kriging model:1||Kyber Pakhtunkhwa:1||LiDAR Point Clouds:1||Lifetime Distribution:1||Lifetime prediction:1||Lightemitting diode (LED):1||Load cycling test:1||Logistic Regression:1||Mahalanobis distance:1||Maintenance engineering:1||Malaria:1||MalcolmBaldrige Model:1||Manufacturing:1||Markov chain Monte Carlo:1||Maximum Likelihood, Minimal Repair:1||Maximum likelihood estimation:1||Metaanalysis:1||Method of Maximum Likelihood:1||Mixture Failure:1||Mixture distribution:1||Mobile display module:1||Modelbased clustering:1||Modified information criterion:1||Monkeypox:1||Monte Carlo simulation:1||Multiphase Semiconductor Process:1||Multistate systems:1||Multimodal theory:1||NSGAII:1||Naïve Bayes:1||National defense quality management:1||Network:1||Network analysis:1||Noises:1||NonLinear MixedEffects Model:1||Nonhomogeneous Poisson Process:1||Nonlinear mixedeffects models:1||Nonparametric control chart:1||Nonparametric regression:1||Numerical models:1||One class support vector machine:1||Operating characteristic (OC) curve:1||Operation Temperature:1||Optimal Parameter Design:1||Optimal Preventive Maintenance:1||Optimal design:1||Organic lightemitting diode (OLED):1||Oversampling:1||PHM:1||Parametric bootstrap:1||Pareto genetic algorithm:1||Perceived quality:1||Plasmodium falciparum:1||Plasmodium vivax:1||Poisson Process:1||Poisson process:1||Polymer electrolyte membrane fuel cell (PEMFC):1||Potential cycling test:1||Power Plant:1||Power law process:1||Prediction:1||Predictive models:1||Prevalence:1||Preventive maintenance:1||Principal curve:1||Probit Model:1||Prognostics and Health Management:1||Prognostics and health management:1||Proportional AgeReduction Model:1||Quality:1||Quantitative index:1||Quasirenewal process:1||R:1||RAM:1||RAM Objective:1||Random Forest:1||Randomcoefficients model:1||Raw Bit Error Rate:1||Reentrant hybrid flowshop:1||Refrigerant noises:1||Reliability Estimation:1||Reliability analysis:1||Reliability assessment:1||Reliability defects:1||Remaining useful life:1||Remaining useful life prediction:1||Repairable System:1||Repairable system:1||Repairable systems:1||Schwarz information criterion:1||Semiconductor device modeling:1||Sentimental Analysis:1||Series reliability structure:1||Shewhart chart:1||Smart Factory:1||Software Reliability:1||Solid State Drive:1||Spatial defects:1||Spatial modeling:1||Spearman’s Rank Correlation:1||Spherical shell:1||Stack:1||State of health:1||Statistical modeling:1||Statistical trend test:1||StepDown Procedure:1||Stochastic compartment:1||Superposed Process:1||Support vector clustering:1||Survey:1||System Reliability:1||T2 chart:1||Text Mining:1||Thermal Power Plant:1||Transfer learning:1||Trend Test:1||Tukey depth:1||TwoSample tTest:1||Vehicle:1||WIener process:1||Wafer Bin Map:1||Wafer map:1||Wavelet Shrinkage:1||Wavelet Spectrum Analysis:1||Wavelet Thresholding:1||Wavelet Transform:1||Wavelet spectrum analysis:1||Wearout Failure:1||Weibull mixture:1||Wiper:1||Word2vec.:1||Yield:1||accelerated destructive degradation test:1||accelerated life test:1||additive model:1||age replacement first:1||auperposed loglinear process:1||average cost rate:1||bathtub and increasing failure rates:1||bathtubshaped intensity:1||bayesian reliability:1||bipolar plate:1||censored data:1||compensatory performance:1||competing risk:1||complex wavelet transform:1||component:1||compromise plan:1||computer experiment:1||condition based maintenance:1||conditionbased maintenance:1||conditional reliability function:1||conjugate priors:1||cumulative exposure model:1||data augmentation:1||data depth:1||datadenoising:1||degradation data:1||degradation model:1||delta approximation:1||dummy variable technique:1||electric vehicles (EVs):1||exponential distribution:1||fatigue curves:1||fault tolerance:1||fault tree analysis:1||fuel cell:1||functional reliability:1||gamma prior:1||gamma process:1||general approximate crossvalidation error:1||generalized Poisson (GP) distribution:1||generalized linear mixed models:1||generalized linear models:1||genetic algorithms:1||hierarchical Bayesian method:1||hurdleatzero (HZ) models:1||image processing:1||integrated logistics support:1||inverse Gaussian distribution:1||iterative quantile regression:1||koutofm:Fsystem:1||lifetime distributionbased procedure:1||lithium batteries:1||logistic distribution:1||maximum entropy sampling:1||maximum likelihood:1||measurement errors:1||metaanalysis:1||metal additive manufacturing:1||model misspecification:1||modified bathtub intensity:1||monitoring:1||multicopy repairable system:1||multistate systems:1||multiple imputation:1||nanotechnology:1||negative binomial regression:1||neural network:1||neuropsychiatric:1||nonhomogeneous poisson process:1||nonlinear randomcoefficients model:1||nonmonotonic trend:1||numerical model:1||organic lightemitting diode:1||partially accelerated degradation test:1||particle filters (PFs):1||pattern recognition:1||pin puller:1||power law process:1||prediction of IC yield:1||principal curve (PC):1||probability of correct selection:1||probability plot:1||prognostics and health management:1||quality control:1||random effects:1||randomeffect:1||randomeffects:1||randomeffects model:1||rank regression method:1||regression:1||reliability evaluation:1||sT(2)chart:1||shock damage:1||similarity:1||similaritybased clustering:1||smart mobile phone:1||spatial clustering:1||spatiotemporal point process:1||spherical shells (SS):1||statistical process control:1||stepdown test:1||stepstress:1||stochastic ordering:1||storage reliability:1||stresslife relationship:1||structural risk minimization:1||superposed Poisson process:1||systemic lupus erythematosus:1||the power law process:1||timebased maintenance policy:1||timedependent dielectric breakdown:1||two types of shocks:1||twophase:1||vanadium redox flow battery:1||wafer bin map:1||wavelet shrinkage:1||wavelet spectrum:1||weibull distribution:1||weighted least squares:1||welding:1||wiener process:1||yield:1||yield management:1||yield prediction:1||zeroinflated poisson regression:1||델타방법:1||작동 신뢰도:1||최우추정법:1||ARIMA:1||프로빗 모델:1||Accelerated Degradation Test:1||Accelerated Degradation Testing:1||Accelerated Test:1||Accelerated degradation:1||Accelerated degradation testing:1||Accelerated degradation tests:1||Aging mechanism:1||Airconditioner:1||Analytical models:1||Artificial neural network:1||Asymptotic variance:1||Atmospheric modeling:1||Autonomous Driving:1||Autoregressive:1||Bankruptcy prediction:1||Battery cycle aging:1||Battery management systems (BMSs):1||Bayes methods:1||Binomial Distribution:1||Bitcoin Gold:1||Bootstrap aggregating:1||Capacity degradation:1||Categorical Response:1||Central Composite Design:1||ChangePoint:1||ChangePoint Analysis:1||Changepoint regression:1||Classification model:1||Clustered defects:1||Combat Readiness:1||Competing mode:1||Condition Based Maintenance(CBM):1||Condition Monitoring:1||Continuous time Markov chain:1||Continuousstate systems:1||Contribution Plot:1||Convolution Neural Network (CNN):1||Cost optimization:1||Coulombic efficiency:1||Doptimal design:1||Doptimality:1||DC motors:1||DDplot:1||DENV:1||

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