ScholarWorks@Hanyang University: Kim, Yong Kyun

Detailed Information

Kim, Yong Kyun (김용균)

COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)

Research Area: 물리학, 핵물리학, Physics, Nuclear Physics

Tel 02-2220-2354
Homepage

ResearcherID ORCiD Scopus Google Scholar ID ResearchGate

Keyword

Plastic scintillator:9||플라스틱 섬광체:7||스틸벤:6||MCNPX:5||semiconductor detector:5||ZnSe:5||Monte Carlo simulation:5||ionization chamber:5||Neutron monitor:4||RAON:4||감마선:4||CZT:4||3D printing:4||EGSnrc:4||RISP:3||afterglow:3||GEANT4:3||pulse height spectrum:3||중성자:3||ISOL:3||Proton radiography:3||Light output:3||radiation detector:3||CR39:3||NM64:3||GEM:3||Neutron detector:3||Recoil spectrometer:3||핵융합:3||Cosmic ray:3||광량:3||leakage current:3||3D 프린터:3||semiconductor scintillator:3||shadow shielding technique:3||Barometric coefficient:3||Small field dosimetry:2||CsI(Tl):2||gammaray irradiation:2||Magic numbers:2||섬광체:2||Black holes:2||Supernovae:2||Gamma Knife:2||InSb:2||Plastic Scintillator:2||Activation foil:2||Bridgman 방법:2||Proton halos:2||3D 프린팅:2||Proton resonant scattering:2||The elements:2||Daejeon neutron monitor:2||neutron detectors:2||온도 구배:2||우주선 중성자:2||Computed Radiography:2||Decay time:2||organic scintillator:2||Thermonuclear reactions:2||RCS leakage:2||26Si(p,γ) 27P reaction:2||Transition strengths:2||Energy resolution:2||Muon facility:2||Muon production target:2||Isomeric decays:2||rprocess:2||radiation damage:2||Radiation damage:2||중성자 모니터:2||UV 경화:2||Radiation detector:2||rpprocess:2||중성자 에너지:2||sprocess:2||중성자 측정:2||Isomers(Isomeric states):2||Unidentified leakage:2||AGB(asymptotic giant branch):2||scintillator:2||Radioactive Ion beam:2||KSTAR:2||NDT:2||HANARO:2||silicon carbide:2||CZT detector:2||Xray bursts:2||silicon surface barrier:2||태양폭발:2||Rare isotope:2||Rare isotope beams (RIB):2||stilbene:2||Rare isotope production:2||Heavyion nuclear reactions:2||Leakage current:2||Neutron detectors:2||absorption:2||Leakage detection system:2||Femtosecond laser:2||μSR:2||γray bursts:2||Neutron flux:2||SANDII:2||Neutron halos:2||alpha response:2||고 감마선장:2||Neutron skins:2||Schottky diode:2||Neutron stars:2||annealing effect:2||Light Output:2||Neutronrich:2||Fluence monitor:2||Nondestructive testing:2||Selenium75:2||Diurnal variation:2||몬테카를로 시뮬레이션:2||Novae:2||crystals:2||Nuclear astrophysics:2||Shell model calculations:2||Si MiniPad:2||Linearity:2||SiC:2||Nucleosynthesis:2||Silicon carbide:2||Organic scintillators:2||emission:2||Forbush decrease:2||Dose conversion coefficient:2||Abundance:2||environmental radiation:2||fast neutron detector:2||Dosimetric characteristics:2||gamma knife:2||비례계수기:2||Irradiation test:1||Isomer:1||KOLAS:1||KoBRA:1||Korea Rare Isotope Accelerator:1||Kr85:1||Lattice damage:1||Leksell Gamma Knife (R) Perfexion (TM):1||Li7(p,n) reaction:1||LiF target:1||Light guide:1||Light yeild:1||Linear plasma devices:1||Localized hand exposure:1||Longterm Stability:1||Lowenergy tail:1||MCNP:1||MDD:1||MICROMEGAS:1||MPCEX:1||Mass measurement:1||MeV Neutron:1||Measurement uncertainty:1||Metalsemiconductor contact:1||Micropattern gas detector:1||Microfluidic calorimeter:1||Minimum detectable dose:1||Modulation transfer function:1||Monte Carlo Simulation:1||MonteCarlo calculation:1||MonteCarlo code:1||MonteCarlo simulation:1||Muon:1||Muon Detector:1||Muon detector:1||Muon spin rotation/relaxation/resonance:1||N16:1||Nγ separations:1||N10:1||NM64, 태양활동:1||NaI(Tl) detector:1||Neutron:1||Neutron Generator:1||Neutron activation analysis:1||Neutron detectors (cold, thermal, fast neutrons):1||Neutron energy:1||Neutron fluence:1||Neutron source:1||Neutron total crosssection:1||Neutronrich rare isotope:1||Neutrons:1||Nonionizing energy loss:1||Nuclear Power Plant:1||Nuclear power plants in China:1||Oulu neutron monitor:1||PHENIX:1||PIGE:1||PIN diode:1||PMI (plasmamaterial interaction):1||PMT:1||PPO:1||Peak centroid fluctuation:1||Penning ion Source:1||Perfexion:1||PhotoPeak:1||Photon counting:1||Photopolymerization:1||Planar detector:1||Planartype detector:1||Polygon:1||Polymerization:1||Proton interaction:1||Protons interactions:1||Pulseshape Discrimination (PSD):1||Pulsed beam:1||QGSP:1||RCS,Window:1||RI:1||RIID:1||RPC Detector:1||Radiation:1||Radiation Measurement:1||Radiation dose assessment:1||Radiative capture cross sections:1||Radioactive effluent:1||Radioactive isotope beam:1||Radioisotope identification:1||Radiophotoluminescent glass dosimeter (RPLGD):1||Radon:1||Rare Isotope Science Project (RISP):1||Rare isotope science project:1||Reactor Coolant System:1||Reactor coolant system:1||Reference thermal neutron field:1||Resistive Plate Chamber:1||Response spectrum:1||Rigidity cutoff:1||Rotating target:1||SCo1:1||SSB:1||Schottky barrier height:1||Schottky detector:1||Scintillation detectors:1||Scintillation efficiency:1||Scintillator:1||Scintillators:1||Scintillators and scintillating fibres and light guides:1||Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators):1||Semiconductor detector:1||Semiconductor printing:1||Semiconductor radiation detector:1||Shell evolution:1||Si28:1||SiC radiation detector:1||Silicon carbide (SiC):1||Silicon detector:1||Silicon detectors:1||Silicon surface barrier:1||SimPacts:1||Simultaneity:1||Singleparticle tracking:1||Sn132:1||Solidstate nucleartrack detector:1||Spatial distribution:1||Spatial resolution:1||Sputtering:1||Stilbene:1||Strip electrode:1||Surface muon:1||Surface muons:1||Surface passivation:1||Surface pattern:1||TOF system:1||TRS483:1||Tablet manufacturing:1||Tandem Van de Graaff accelerator:1||Target lifetime:1||Temperature dependence:1||Tetrahedron:1||Thermal evaporation:1||Thermal neutron detector calibration:1||Thermal neutron fluence:1||Thermal neutron flux monitor:1||Threshold detector:1||Total cross section:1||Transmittance:1||Treatment plan:1||Treatment planning system:1||U238 fission:1||UCx:1||UCx target:1||UV curing:1||Ultraintense laser:1||Unfolding:1||Vertical Bridgman 성장법:1||Volume measurement:1||Volumetric dosimetry:1||W:1||W/Si preshower:1||Wavelength shifter:1||Wavelength shifter fiber:1||Xray:1||Xray diffractometer:1||Xray imaging:1||Xray spectra:1||Xray transmittance:1||XRD:1||ZnS(Ag):1||ZnS(Ag) layer:1||ZnS(Ag) thin film:1||absorption band:1||accelerator:1||active area:1||air:1||alpha detection:1||alpha detector:1||alpha energy spectrum:1||alphaparticle detectors:1||analysis:1||angular dependence:1||annealing:1||area radiation monitoring:1||betaDecay:1||betaray detectors:1||cadmium zinc telluride (CZT):1||charged particle:1||composite material:1||composite scintillators:1||correlation:1||cosmic ray:1||currentvoltage characteristics:1||decay time:1||differential response function:1||discrimination technique:1||electron:1||electron accelerator:1||electron confinement time:1||electron temperature:1||emission 파장:1||energy resolution:1||energy spectrum:1||evaporation:1||frameless radiosurgery:1||gallium arsenide:1||gamma) reaction:1||gammaRay spectroscopy:1||gas radiation detector:1||global record high:1||guard electrode:1||highpressure Xe:1||hole:1||image coregistration:1||inorganic scintillator:1||ion chamber:1||ion transit time:1||ionpair nonuniformity:1||k(Qmsr, Q0)(fmer, fref):1||mean free path:1||metal electrode:1||metalsemiconductor contact:1||n separation:1||ngamma separation:1||nrich:1||n/gamma discrimination:1||n/γ 분리:1||neutron detector:1||neutron measurement:1||neutron monitor:1||organic compounds:1||output current:1||output factor:1||pin diode detector:1||photodiode:1||planartype detector:1||plasma:1||polarity effect:1||polycrystal:1||positional accuracy:1||pulsed radiation:1||radiation detectors:1||radiation monitoring system (RMS):1||room temperature:1||saturation curve:1||scintillation detectors:1||scintillation dosimeter:1||scintillators:1||semiinsulator:1||semiconductor:1||semiconductor detectors:1||semiconductor neutron detector:1||shielding mesh:1||silicon carbide (SiC):1||silicon carbide(SiC):1||small field dosimetry:1||solid state detector:1||strip electrode:1||surface barrier detector:1||surface passivation:1||surface polishing:1||surface roughness:1||thermal neutron:1||thermal treatment:1||transmission spectrum:1||twovoltage method:1||whole procedure test:1||zinc sulfide:1||감마나이프:1||감마선 폭발체:1||감쇠 시간:1||감쇠시간:1||검사:1||검은구멍:1||고속 중성자:1||고속중성자 조사량:1||고체비적검출기:1||광섬유:1||교정 값 간접산출:1||냉각재 누설:1||누설감지:1||느린중성자포획과정:1||단결정:1||데이터 전처리:1||두경부 팬텀:1||마법수:1||몬테칼로:1||뮤온 생성 표적:1||뮤온 시설:1||미세먼지:1||반감기:1||반도체:1||반응 시간:1||방사선 검사:1||방사선 검출기:1||방사선 기기:1||방사선 차폐:1||방사선기기:1||방사선측정:1||방사성동위원소 식별:1||방출파장:1||베타 검출기:1||베타측정:1||보너구 설계:1||분해능:1||불확실도:1||비교기:1||비파괴검사:1||빠른양성자포획과정:1||빠른중성자포획과정:1||선량 측정:1||선량 평가:1||섬광체 선량계:1||섬광체의 두께:1||셀레륨75:1||속중성자 투과:1||수분함량 측정:1||스틸벤 섬광체:1||스펙트럼 데이터:1||시험기관:1||신성:1||신호처리 시스템:1||신호처리 알고리즘:1||실리콘 카바이드:1||아이소머:1||양성자 radiography:1||양성자 달무리핵:1||양성자 반응:1||에너지 교정:1||에너지 분해:1||엑스선:1||엑스선 폭발체:1||열핵반응:1||원소:1||원통형 3He 비례계수기:1||응답 함수:1||의료방사선:1||이리듐192:1||인정기준:1||인정제도:1||전산모사:1||전자상자성공명:1||점근거성계열:1||정수형 데이터:1||조사량 감시자:1||조사량 평가:1||존재비:1||중성자 Timeofflight:1||중성자 감속재:1||중성자 검출기:1||중성자 계측:1||중성자 달무리핵:1||중성자 반응함수:1||중성자 선량당량계:1||중성자 선량측정:1||중성자 조사량:1||중성자 피부핵:1||중성자감마 분리:1||중성자발생기:1||중성자별:1||중이온핵반응:1||중합 반응:1||즉발감마선:1||질량:1||차폐 해석:1||천체핵물리학:1||체렌코프:1||초신성:1||측정 가능한 최소 선량:1||치료계획프로그램:1||치료선량:1||치아에나멜:1||카드뮴 징크 텔루라이드:1||태양활동:1||펨토초 레이저:1||표면 뮤온:1||플라스틱 섬광채:1||플라스틱섬광체:1||플라스틱성광체:1||하나로 조사시험:1||한국인정기구:1||핵조성:1||핵종분석:1||현미경:1||형광분광법:1||회구적 선량평가:1||회전 표적:1||(p,p &apos:1||희귀동위원소빔:1||127Ag:1||16 N:1||16N:1||1차 계통 냉가수:1||252Cf, ToF time spectrum:1||3D Printing:1||3D printed scintillator:1||3D 프린팅 섬광체:1||3Dprinted tumor model:1||3Dprinting:1||3He 비례계수기:1||3d 프린터:1||ANSI:1||ARMS (Area Radiation Monitoring System):1||Absolute measurement:1||Absorbed dose:1||Absorbed dose calculation:1||Absorbed energy:1||Acrylate monomer:1||Al:1||Algorithm:1||Alpha particle:1||Alpha particle detectors:1||Alpha spectroscopy:1||Ambient dose equivalent:1||Artificial neural network:1||Atmospheric dispersion:1||BC408:1||BGO Single Crystal:1||Beam Profile Monitor (BPM):1||Beam quality correction factor:1||Beam transport:1||Beamline design:1||Bertini cascade:1||Beta detector:1||Beta gauge:1||Betaray detector:1||Binary cascade:1||Bisphenol fluorene diacrylate:1||Bremsstrahlung Xray:1||Bridgman:1||C12:1||CEM:1||CR39 SSNTD:1||Calibration:1||CdZnTe:1||CdZnTe detector:1||Cf252, 대인 지뢰:1||Charged particle detector:1||Compon edge:1||Compton Edge:1||Compton suppression detector:1||Computed radiography:1||Convection:1||Convolutional neural networks:1||Coolant leakage detection system:1||Cosmic Ray:1||Cosmic radiation:1||Cosmicray:1||Cs1(T1) 검출기:1||Cutoff rigidity:1||Czochralski Method:1||DT Generator:1||DCC:1||DLP 3D 프린터:1||Damage to bulk:1||Degradation:1||Density measurement:1||Detection efficiency:1||DiPS2:1||Diffusion:1||Digital Light Processing (DLP) 3D Printer:1||Dispersion matching:1||Dose:1||Dosimeter:1||ECR ion source:1||ELM (edge localized mode):1||ENDF:1||ENDL:1||EXPACS:1||Electron paramagnetic resonance:1||Electron paramagnetic resonance (EPR) spectroscopy:1||Emission Wavelength:1||Emission wavelength:1||Energy Resolution:1||FADC:1||FTFP:1||FWHM:1||Fast Response:1||Fast neutron:1||Fingernail:1||Fluence rate determination:1||Fluorescence spectrum:1||Fragmentation facilities:1||G4LEND:1||G4NeutronHP:1||GD352M:1||GSO:1||GaAs:1||GaAs Schottky diode:1||Gamma rays:1||Gammaknife Perfexion:1||Gammaray detection:1||Gammaray spectrum:1||GamowTeller β decay:1||Garfield:1||Geant4:1||Germanium detectors:1||Gold:1||H3(p,n)He3:1||He3 proportional chamber:1||Heavy ion:1||Hecht equation:1||High cutoff rigidity:1||High energy physics instrumentation computing:1||High gammaray field:1||Highprecision radiotherapy:1||Hydrogen Beam Current:1||IV curve:1||IAEA:1||IAEA phasespace:1||Image plate:1||Imaging plate detector:1||Incore detector:1||Incore experiment:1||Inflight fragmentation:1||Inflight separator:1||In/CZT contact:1||InAs:1||Indium:1||Intranuclear cascade:1||Ion optics:1||Ionization Chamber:1||Ionization chamber:1||Ionizing radiation:1||Iridium192:1||

STATISTICS: Total View :4,937,524; Today View :4,395

RSS_1.0 RSS_2.0 ATOM_1.0

222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1365

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Detailed Information

Keyword

BROWSE