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Results 1-1 of 1 (Search time: 0.002 seconds).
A two-level redundancy scheme for enhancing scalability of molecular-based crossbar memories
Choi, Y.-H.; Lee, M.-H.;
Kim, Y.K.
Article
Issue Date
2004
Citation
2004 4th IEEE Conference on Nanotechnology, pp.505 - 508
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Choi, Yoon Hwa
1
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Defect tolerance
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Molecular electronics
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Redundancy
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Scalable memory
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Article
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English
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2004 4th IEEE Conference on Nanot...
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