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Effect of the surface correlation length on microwave forward reflection from a randomly rough lossy dielectric surface

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dc.contributor.authorPark, Sinmyong-
dc.contributor.authorS.-
dc.contributor.authorOh, Yisok-
dc.contributor.authorY.-
dc.date.available2021-03-17T11:41:41Z-
dc.date.created2021-02-26-
dc.date.issued2015-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/13850-
dc.titleEffect of the surface correlation length on microwave forward reflection from a randomly rough lossy dielectric surface-
dc.typeArticle-
dc.contributor.affiliatedAuthorOh, Yisok-
dc.identifier.doi10.1109/IGARSS.2015.7325862-
dc.identifier.scopusid2-s2.0-84962573986-
dc.identifier.bibliographicCitationInternational Geoscience and Remote Sensing Symposium (IGARSS), v.2015-November, pp.708 - 710-
dc.relation.isPartOfInternational Geoscience and Remote Sensing Symposium (IGARSS)-
dc.citation.titleInternational Geoscience and Remote Sensing Symposium (IGARSS)-
dc.citation.volume2015-November-
dc.citation.startPage708-
dc.citation.endPage710-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscopus-
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