ArticleIssue Date2008CitationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.16 - 23PublisherIEEE COMPUTER SOC
ArticleIssue Date2008CitationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.229 - 235PublisherIEEE COMPUTER SOC