Khan, Omair Ahmad; Shah, Munam Ali; Din, Ikram Ud; Kim, Byung-Seo; Khattak, Hasan Ali; Rodrigues, Joel J. P. C.; Farman, Haleem; Jan, Bilal
ArticleIssue Date2018CitationIEEE ACCESS, v.6, pp.75899 - 75911PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC