An Improved Radiative Transfer Model for Polarimetric Backscattering from Agricultural Fields at C- and X-Bands
DC Field | Value | Language |
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dc.contributor.author | Oh, Yisok | - |
dc.contributor.author | Chang, Jisung Geba | - |
dc.contributor.author | Shoshany, Maxim | - |
dc.date.accessioned | 2021-09-02T02:42:00Z | - |
dc.date.available | 2021-09-02T02:42:00Z | - |
dc.date.created | 2021-08-18 | - |
dc.date.issued | 2021-04 | - |
dc.identifier.issn | 2671-7255 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/15554 | - |
dc.description.abstract | The first-order vector radiative transfer model (FVRTM) is modified mainly by examining the effects of leaf curvature of vegetation canopies, the higher-order multiple scattering among vegetation scattering particles, and the underlying-surface roughness for forward reflection on radar backscattering from farming fields at C- and X-bands. At first, we collected the backscattering coefficients measured by scatterometers and space-borne synthetic aperture radar (SAR), field-measured ground-truth data sets, and theoretical scattering models for radar backscattering from vegetation fields at microwaves. Then, these effects on the RTM were examined using the database at the C- and X-bands. Finally, an improved RTM was obtained by adjusting its parameters, mainly related with the leaf curvature, the higherorder multiple scattering, and the underlying-surface small-roughness characteristics, and its accuracy was verified by comparisons between the improved RTM and measurement data sets. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | KOREAN INST ELECTROMAGNETIC ENGINEERING & SCIENCE | - |
dc.subject | ELECTROMAGNETIC SCATTERING | - |
dc.title | An Improved Radiative Transfer Model for Polarimetric Backscattering from Agricultural Fields at C- and X-Bands | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Oh, Yisok | - |
dc.identifier.doi | 10.26866/jees.2021.21.2.104 | - |
dc.identifier.scopusid | 2-s2.0-85106619367 | - |
dc.identifier.wosid | 000651537200003 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTROMAGNETIC ENGINEERING AND SCIENCE, v.21, no.2, pp.104 - 110 | - |
dc.relation.isPartOf | JOURNAL OF ELECTROMAGNETIC ENGINEERING AND SCIENCE | - |
dc.citation.title | JOURNAL OF ELECTROMAGNETIC ENGINEERING AND SCIENCE | - |
dc.citation.volume | 21 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 104 | - |
dc.citation.endPage | 110 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART002714331 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.subject.keywordPlus | ELECTROMAGNETIC SCATTERING | - |
dc.subject.keywordAuthor | Backscattering Coefficient | - |
dc.subject.keywordAuthor | Leaf Curvature | - |
dc.subject.keywordAuthor | Multiple Scattering | - |
dc.subject.keywordAuthor | Radiative Transfer Model | - |
dc.subject.keywordAuthor | Surface Roughness | - |
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