Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
DC Field | Value | Language |
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dc.contributor.author | Otieno, Luke Oduor | - |
dc.contributor.author | Alunda, Bernard Ouma | - |
dc.contributor.author | Kim, Jaehyun | - |
dc.contributor.author | Lee, Yong Joong | - |
dc.date.accessioned | 2021-09-02T02:43:22Z | - |
dc.date.available | 2021-09-02T02:43:22Z | - |
dc.date.created | 2021-03-11 | - |
dc.date.issued | 2021-01 | - |
dc.identifier.issn | 1424-8220 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/15651 | - |
dc.description.abstract | A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1 mu mx1 mu m with 100x100 pixels. | - |
dc.publisher | Multidisciplinary Digital Publishing Institute (MDPI) | - |
dc.title | Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Jaehyun | - |
dc.identifier.doi | 10.3390/s21020362 | - |
dc.identifier.scopusid | 2-s2.0-85099085376 | - |
dc.identifier.wosid | 000611722200001 | - |
dc.identifier.bibliographicCitation | Sensors, v.21, no.2, pp.1 - 14 | - |
dc.relation.isPartOf | Sensors | - |
dc.citation.title | Sensors | - |
dc.citation.volume | 21 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 14 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Analytical | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.subject.keywordAuthor | Atomic force microscopy | - |
dc.subject.keywordAuthor | High-speed atomic force microscope | - |
dc.subject.keywordAuthor | High-speed atomic force microscope scan-head | - |
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