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Minimal Aliasing Single-Error-Correction Codes for DRAM Reliability Improvement
- Authors
- Pae, Sung-il; Kozhikkottu, V.; Somasekar, D.; Wu, W.; Ramasubramanian, S.G.; Dadual, M.; Cho, H.; Kwon, Konwoo
- Issue Date
- 2021
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- In-DRAM error correcting code; minimal aliasing code; single error correction
- Citation
- IEEE Access, v.9, pp.29862 - 29869
- Journal Title
- IEEE Access
- Volume
- 9
- Start Page
- 29862
- End Page
- 29869
- ISSN
- 2169-3536
- Abstract
- We discuss the problem of finding a minimal aliasing code among a class of systematic single-error-correction codes that are suitable to be implemented within DRAM die, as opposed to external ECC used in memory controller outside of DRAM chip. We prove a sharp lower bound of aliasing probability and propose a simple method to come up with a code that meets the bound. By an experiment, we also demonstrate that a randomly chosen code is likely to have much more aliasings with overwhelmingly high probability. ? 2013 IEEE.
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Related Researcher
- Kwon, Kon-Woo
- Engineering (Department of Computer Engineering)