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Inverse relationship between exo-electron currents and statistical delay of AC PDPs
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kuang, Y. | - |
| dc.contributor.author | Choi, K.-H. | - |
| dc.contributor.author | Kim, Y.-S. | - |
| dc.date.accessioned | 2021-12-17T04:42:21Z | - |
| dc.date.available | 2021-12-17T04:42:21Z | - |
| dc.date.created | 2021-12-16 | - |
| dc.date.issued | 2010 | - |
| dc.identifier.issn | 0000-0000 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/21661 | - |
| dc.description.abstract | A relationship between exo-electron current and statistical relationship was examined on AC PDP test panels with or without MgO nano-crystals sprayed on MgO layer. The results indicated that the statistical delay is inversely proportional to exo-electron currents, but its proportional constant varies significantly, depending on the presence of MgO nano-crystals. © 2010 ITE and SID. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.title | Inverse relationship between exo-electron currents and statistical delay of AC PDPs | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, Y.-S. | - |
| dc.identifier.scopusid | 2-s2.0-79956332182 | - |
| dc.identifier.bibliographicCitation | IDW'10 - Proceedings of the 17th International Display Workshops, v.2, pp.961 - 962 | - |
| dc.relation.isPartOf | IDW'10 - Proceedings of the 17th International Display Workshops | - |
| dc.citation.title | IDW'10 - Proceedings of the 17th International Display Workshops | - |
| dc.citation.volume | 2 | - |
| dc.citation.startPage | 961 | - |
| dc.citation.endPage | 962 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
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