Markov Chain Monte Carlo를 이용한 반도체 결함 클러스터링 파라미터의 추정
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 하정훈 | - |
dc.contributor.author | 장준현 | - |
dc.contributor.author | 김준현 | - |
dc.date.accessioned | 2022-01-03T06:42:52Z | - |
dc.date.available | 2022-01-03T06:42:52Z | - |
dc.date.created | 2021-12-28 | - |
dc.date.issued | 2009 | - |
dc.identifier.issn | 2005-0461 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/22162 | - |
dc.description.abstract | Negative binomial yield model for semiconductor manufacturing consists of two parameters which are the average number of defects per die and the clustering parameter. Estimating the clustering parameter is quite complex because the parameter has not clear closed form. In this paper, a Bayesian approach using Markov Chain Monte Carlo is proposed to estimate the clustering parameter. To find an appropriate estimation method for the clustering parameter, two typical estimators, the method of moments estimator and the maximum likelihood estimator, and the proposed Bayesian estimator are compared with respect to the mean absolute deviation between the real yield and the estimated yield. Experimental results show that both the proposed Bayesian estimator and the maximum likelihood estimator have excellent performance and the choice of method depends on the purpose of use. | - |
dc.language | 한국어 | - |
dc.language.iso | ko | - |
dc.publisher | 한국산업경영시스템학회 | - |
dc.title | Markov Chain Monte Carlo를 이용한 반도체 결함 클러스터링 파라미터의 추정 | - |
dc.title.alternative | Estimation of Defect Clustering Parameter Using Markov Chain Monte Carlo | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 하정훈 | - |
dc.identifier.bibliographicCitation | 한국산업경영시스템학회지, v.32, no.3, pp.99 - 109 | - |
dc.relation.isPartOf | 한국산업경영시스템학회지 | - |
dc.citation.title | 한국산업경영시스템학회지 | - |
dc.citation.volume | 32 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 99 | - |
dc.citation.endPage | 109 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART001377157 | - |
dc.description.journalClass | 2 | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Yield Model | - |
dc.subject.keywordAuthor | Clustering Effect | - |
dc.subject.keywordAuthor | Parameter Estimation | - |
dc.subject.keywordAuthor | Markov Chain Monte Carlo | - |
dc.subject.keywordAuthor | Bayesian Estimation | - |
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