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Millisecond crystallization of amorphous silicon films by Joule-heating induced crystallization using a conductive layer

Authors
Hong, Won-EuiRo, Jae-Sang
Issue Date
7-May-2007
Publisher
ELSEVIER SCIENCE SA
Keywords
Joule-heating; crystallization; LTPS; AMOLED; thin film transistors
Citation
THIN SOLID FILMS, v.515, no.13, pp.5357 - 5361
Journal Title
THIN SOLID FILMS
Volume
515
Number
13
Start Page
5357
End Page
5361
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/23592
DOI
10.1016/j.tsf.2007.01.028
ISSN
0040-6090
Abstract
This study revolved around the introduction of a crystallization technology for amorphous silicon film using Joule-heating. As part of this study, an electric field was applied to a conductive layer to induce Joule-heating in order to generate the intense heat needed to carry out the crystallization of amorphous silicon. Polycrystalline silicon was produced via Joule-heating through a solid state transformation under typical processing conditions. Uniformly distributed fine grains were obtained due to enormously high heating rate of this process. Crystallization was accomplished throughout the sample within the range of milliseconds of the heating, thus demonstrating the possibility of a crystallization route for amorphous silicon films at room temperature. (c) 2007 Elsevier B.V. All rights reserved.
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