Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A defect-tolerant molecular-based memory architecture

Full metadata record
DC Field Value Language
dc.contributor.authorChoi, Y.-H.-
dc.contributor.authorLee, M.-H.-
dc.date.accessioned2022-01-14T09:43:43Z-
dc.date.available2022-01-14T09:43:43Z-
dc.date.created2022-01-14-
dc.date.issued2007-
dc.identifier.issn1550-5774-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/24281-
dc.description.abstractThis paper presents a defect-tolerant architecture for molecular-based memories. A memory is designed from multiple modules that share the same address space, where each of the modules is constructed as a molecular-based crossbar array. Redundant rows and columns of each crossbar array and redundant modules with a proper assignment of control variables are utilized to tolerate defects generated during the fabrication process and faults occurring during normal operation. The crossbar area required for the molecular memory can be made smaller than those of existing schemes, while achieving higher memory configurability. An extensive simulation demonstrates that the proposed memory architecture outperforms existing molecular-based redundant memory architectures for a wide range of defect rates.© 2007 IEEE.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE COMPUTER SOC-
dc.titleA defect-tolerant molecular-based memory architecture-
dc.typeArticle-
dc.contributor.affiliatedAuthorChoi, Y.-H.-
dc.identifier.doi10.1109/DFT.2007.22-
dc.identifier.scopusid2-s2.0-67649961236-
dc.identifier.wosid000251315800016-
dc.identifier.bibliographicCitationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.143 - 151-
dc.relation.isPartOfProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems-
dc.citation.titleProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems-
dc.citation.startPage143-
dc.citation.endPage151-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaAutomation & Control Systems-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryAutomation & Control Systems-
dc.relation.journalWebOfScienceCategoryComputer Science, Software Engineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
Files in This Item
There are no files associated with this item.
Appears in
Collections
Department of General Studies > Department of General Studies > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE